Search BSI Knowledge
Cookie Settings
IEC 60749-27:2003 | 1 Oct 2003 | BSI Knowledge
Standard
Withdrawn
Subscription Exclusive
IEC 60749-27:2003
Semiconductor devices. Mechanical and climatic test methods - Electostatic discharge (ESD) sensivity testing. Machine model (MM)
Published:
1 Oct 2003
•
Withdrawn:
Date not available
Overview
Preview
References
History
Visit the preview section for more information
Product Details
Descriptors
—
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
—
ISBN
2 8318 7220 0
Publisher
IEC