Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. IEC 60748-4 contains measuring methods for ADCs in which the test conditions are either static or change very slowly. However, some of the characteristics of an ADC can change to some degree with the rate of change of the input signal, and other characteristics cannot be measured except under dynamic conditions. Consequently, a set of dynamic tests is required in order to obtain the response of an ADC when operated under dynamic conditions.
BS IEC 60748-4-3 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics. BS IEC 60748-4-3 contains terms and definitions, characteristics and measuring methods like dynamic testing with sinusoidal signals, dynamic tests with wideband signals, linearity error of a linear ADC and differential linearity error for ADC.
BS EN BS IEC 60748-4-3 on dynamic criteria for analogue-digital converters is useful for:
Integrated circuits are fundamental building blocks of modern electronic devices. They function as an oscillator, timer, computer memory, amplifier, microcontroller, microprocessor, counter or logic gate. There are certain specifications regarding the performance of these semiconductor devices.
BS IEC 60748-4-3 introduces a set of dynamic methods, which are now coming into use in industry and which rely mostly on measurements made with sinusoidal input signals, and of which the results are suitable for analysis in the frequency domain. It also includes a further dynamic method that uses a wide-band input signal.
The guidelines in BS IEC 60748-4-3 help you perceive the dynamic criteria for analogue-digital converters that enable you to provide a superior quality product to your customers.
IEC 60748-4-3:2006
IEC 62056-31:1999