BS IEC 60747-10 discusses the Harmonized system of quality assessment for electronic components. This helps in manufacturing good quality discrete devices and integrated circuits used in semiconductor devices.
BS IEC 60747-10 is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.
BS IEC 60747-10 defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:
NOTE This publication must be supplemented by the approved sectional, family, and blank detail specifications, where they exist, appropriate to the specific individual type or types.
BS IEC 60747-10 on Discrete devices and integrated circuits used in semiconductor devices is useful for:
A potentiometer is a type of position sensor. They are used to measure displacement in any direction. Rotary potentiometers are useful in measuring rotational displacement.
BS IEC 60747-10 specifies the test method and test procedure for discrete devices and integrated circuits used in semiconductor devices. The test methods are as follows :
BS IEC 60747-10 is useful in determining the preferred values of voltages, currents, and temperatures. By applying BS IEC 60747-10, you can manufacture good quality discrete devices and integrated circuits used in semiconductor devices.
IEC 60747-10:1991