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BS IEC 60747-1:2006+A1:2010 | 30 Jun 2006 | BSI Knowledge
Standard
BS IEC 60747-1:2006+A1:2010
Semiconductor devices - General
Current
•
Published:
30 Jun 2006
Overview
Preview
References
History
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Product Details
Descriptors
Colour codes
Endurance testing
Terminology
Electrical measurement
Letters (symbols)
Measurement
Acceptance (approval)
Reliability
Electrical testing
Semiconductor devices
Electric terminals
Testing conditions
Symbols
Graphic symbols
Marking
Sensitivity
Ratings
Electrostatics
Integrated circuits
Position
Identification methods
Storage
Labels
Electronic equipment and components
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
IEC 60747-1:2006/AMD1:2010
ISBN
978 0 580 68217 9
Publisher
BSI