BS IEC 62951‑5 is an international standard used for semiconductor devices that specifies the test methods which helps in determining the thermal characteristics of flexible materials in flexible and stretchable semiconductor devices.
BS IEC 62951‑5 is the fifth part of semiconductor devices in multi-series.
BS IEC 62951-5 specifies the test method for thermal characteristics of flexible materials. BS IEC 62951‑5 includes terms, definitions, symbols, and test methods that can be used to evaluate and determine thermal characteristics of flexible materials for practical use.
The measurement method relies on non-contact optical thermometry that is based on temperature-dependent optical reflectance. BS IEC 62951‑5 is applicable to both substrate and thin-film flexible semiconductor materials that are subjected to bending and stretching.
BS IEC 62951‑5 on semiconductor devices is useful for:
Semiconductor devices are neither good insulators nor good conductors. These flexible and stretchable semiconductor devices create flexibility, stretchability or comfortable devices with electronic properties.
BS IEC 62951-5 helps in changing the refractive index of materials as a function of temperature with the help of optical thermal characterization techniques. The measuring reflectance is useful in determining whether the specimen is substrate or thin-film. The apparatus and test procedures are mentioned in BS IEC 62951‑5 is useful in performing the test.
BS IEC 62951‑5 specifies the test method for flexible semiconductor devices which helps in evaluating thermal characteristics of flexible materials for semiconductor devices. This test method helps in manufacturing better quality semiconductor devices that can be used flexibly in any devices.
IEC 62951-5 Ed.1.0