BS IEC 62951-6:2019

What is BS IEC 62951‑6 - Semiconductor devices about?  

BS IEC 62951-6 is the sixth part of an International Standard used for Semiconductor devices.  

BS IEC 62951-6 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.  

Who is BS IEC 62951-6 - Semiconductor devices for? 

BS IEC 62951-6 Semiconductor devices are beneficial for: 

• Semiconductor foundries 
• Manufacturers of electronic devices 
• Manufacturers of automobile 
• Quality control executives 

Why should you use BS IEC 62951-6 - Semiconductor devices? 

A semiconductor device is an electronic component that contains the electronic properties of semiconductor material. 

BS IEC 62951-6 specifies the test methods and test procedure for sheet resistance of flexible conducting films used in semiconductor devices. The test methods help in measuring the sheet resistance are as follows:  

• The 2-point probe test method is useful in measuring the In situ which help in determining the errors that are caused by probe resistance and the contact resistance. 
• This 4-point probe method is an electric measuring technique for separating the pairs of current-carrying and voltage-sensing electrodes. 
• Montgomery method is useful in measuring the sheet resistance that helps in ensuring the anisotropic resistivity of these devices.  

 By using BS IEC 62951-6, you can ensure the sustainability of these flexible conducting films in different conditions that results in manufacturing good quality semiconductor devices.