BS IEC 60747-14-4 is the 14th part of a multi-series standard used for semiconductor devices that specifies the test and measuring methods for semiconductor accelerometers. This is useful in manufacturing good quality semiconductor accelerometers used in Discrete devices.
BS IEC 60747-14-4 applies to semiconductor accelerometers for all types of products.
BS IEC 60747-14-4 standard applies not only to typical semiconductor accelerometers with built-in electric circuits but also to semiconductor accelerometers accompanied by external circuits. BS IEC 60747-14-4 does not (or should not) violate (or interfere with) the agreement between customers and suppliers in terms of a new model or parameters for business.
Note 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass-produced type of accelerometer.
Note 2: The purpose of BS IEC 60747-14-4 is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved. The descriptions are based on the latest research results. One typical example is the multi-axis accelerometer. BS IEC 60747-14-4 states the method of measuring acceleration as a vector quantity using multi-axis accelerometers.
NOTE 3: This standard does not conflict in any way with any existing parts of either ISO 16063 or ISO 5347. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC.
BS IEC 60747-14-4 on Semiconductor accelerometers is useful for:
A semiconductor device is an electronic component that contains the electronic properties of semiconductor material.
BS IEC 60747-14-4 specifies the environment and reliability test methods and procedures for semiconductor accelerometers. This also helps in measuring the calibration of these accelerometers. With the help of BS IEC 60747-14-4, you can determine the characteristics of these semiconductor accelerometers.
By applying BS IEC 60747-14-4, you can ensure the reliability and sustainability of these accelerometers in different climatic conditions. This helps in manufacturing good quality semiconductor accelerometers used in Discrete devices.
IEC 60747-14-4:2011