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IEC 63229:2021 | 7 Apr 2021 | BSI Knowledge
Standard
IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Current
•
Published:
7 Apr 2021
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Product Details
Descriptors
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ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
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ISBN
978-2-8322-9669-1
Publisher
IEC