Standard

BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET

Current

•

Published:

31 Mar 2023

1 Scope

This part of IEC 62373 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).

This document also defines the terms pertaining to the conventional BTI test method.

Product Details

Descriptors

Transistors

Metal oxide semiconductors

Electronic equipment and components

Temperature

Semiconductors

Voltage measurement

Semiconductor devices

Testing conditions

ICS Codes

31.080.30 Transistors

Committee

EPL/47

International relationships

Identical to:

IEC 62373-1 Ed.1.0

ISBN

978 0 580 51373 2

Publisher

BSI