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IEC 62373-1:2020 | 15 Jul 2020 | BSI Knowledge
Standard
IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET
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Published:
15 Jul 2020
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Product Details
Descriptors
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ICS Codes
31.080.30 Transistors
Committee
EPL/47
International relationships
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ISBN
978-2-8322-8610-4
Publisher
IEC