BS EN 61164 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme.
These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
BS EN 61164 on reliability growth test methods is useful for:
The process of gathering, modelling, analyzing, and interpreting data from the reliability growth development test programme is known as reliability growth analysis (development testing). Two types of input are required. The first one is for reliability growth planning through analysis and design improvements in the design phase in terms of the design phase duration, initial reliability, reliability goal, and planned design improvements, along with their expected magnitude. The second input, for reliability growth in the project validation phase, is for a data set of accumulated test times at which relevant failures occurred or were observed, for a single system, and the time of termination of the test, if different from the time of the final failure.
BS EN 61164 provides its users with the power-law reliability growth model and related projection model and gives step-by-step directions for their use. There are several reliability growth models available, the power-law model is one of the most widely used. BS EN 61164 provides procedures to estimate some or all of the quantities listed in Clauses 4, 6 and 7 of IEC 61014. Using BS EN 61164 best practice guidelines ensures its user’s reliability, security, credibility and achieves global acceptance.
EN 61164:2004
IEC 60311:2002/AMD2:2009
IEC 61164:2004