BS IEC 62396-2:2017

What is BS IEC 62396‑2 - Guidelines for SEE testing for avionics systems about?   

BS IEC 62396‑2 is an international standard for process management for avionics that specifies guidelines for single event effects testing for avionics systems. 

BS IEC 62396‑2 is the second part of the series that aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. 

Who is BS IEC 62396‑2 - Guidelines for SEE testing for avionics systems for?  

BS IEC 62396‑2 on process management for avionics is useful for:  

• Electronic equipment manufacturers 
• Aerospace electric equipment and system manufacturers and designers 
• Electronic component vendors 
• Private companies 
• Government agencies  
• Aerospace industry 
• Aeronautical engineers 

Why should you use BS IEC 62396‑2- Guidelines for SEE testing for avionics systems?   

Avionics is a combination of aviation and electronics and is useful in communicating, navigating, monitoring, and controlling the flight. This industry-wide international standard provides additional guidance to avionics systems designers, electronic equipment manufacturers and their customers for determining the susceptibility of electronic components to single event effects. 

The goal of any SEE testing for avionics applications is to determine the predicted SEE rates in electronic components and/or complete boards based on the SEE testing findings. 

BS IEC 62396‑2 provides guidance on the use of existing SEE data, sources of data and the types of accelerated radiation sources used. Where SEE data is not available considerations for testing are introduced, including suitable radiation sources for providing avionics SEE data. The conversion of data obtained from differing radiation sources into avionics SEE rates is also detailed. 

Overall, BS IEC 62396‑2 can help determine failure rates, minimize atmospheric radiation effects and improve overall product management systems. 

What’s changed since the last update?  

BS IEC 62396‑2:2017 supersedes BS IEC 62396‑2:2012, which is withdrawn. BS IEC 62396‑2:2017 includes some technical changes with respect to BS IEC 62396‑2:2012. These include:  

• Improvements and changes to test facilities have been added in Clause 7, which includes new facilities at TSL, TRIUMF, and ChipIr, 
• Links with IEC 60749-38 and IEC 60749-44 are made in 7.1