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BS IEC 61649:1997 | 15 Sep 1997 | BSI Knowledge
Standard
Withdrawn
BS IEC 61649:1997
Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Published:
15 Sep 1997
•
Withdrawn:
28 Feb 2009
Overview
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History
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Product Details
Descriptors
Statistical methods of analysis
Statistical distribution
Formulae (mathematics)
Electrical equipment
Electronic equipment and components
Statistical tolerance intervals
Accuracy
Reliability
Normal distribution
Estimation
Electrical components
Statistical testing
Failure (quality control)
Confidence limits
ICS Codes
03.120.30 Application of statistical methods
21.020 Characteristics and design of machines, apparatus, equipment
29.020 Electrical engineering in general
Committee
DS/1
International relationships
Identical to:
IEC 61649:1997
ISBN
0 580 28098 5
Publisher
BSI