PD IEC TS 62804‑1‑1 is the first part of the multi-series International standard that specify procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules principally those with one or two glass faces.
PD IEC TS 62804‑1‑1 determines the amount of delamination caused by current transmission between the ground and the module cell circuit. elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp-heat exposure, sodium accumulation at interfaces, cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied is not considered in the scope.
PD IEC TS 62804‑1‑1 on photovoltaic (PV) modules is relevant to:
PD IEC TS 62804‑1‑1 aids is for testing and evaluating the durability of crystalline silicon PV modules for PID in the mode of delamination (PID-d), as may be induced by the stress factors of moisture and system voltage.
PD IEC TS 62804‑1‑1 provides standardized test methods of delamination of PV modules to prevent failures like electrical shocks, ground faults, rapid moisture ingress or collection of condensed moisture and can be associated with corrosion etc. which improves efficiency and reliability of Photovoltaic (PV) modules.
Overall, PD IEC TS 62804‑1‑1 guides users to improve the durability of the design of the Photovoltaic (PV) module to system voltage stress as well as the effects of any variability of the materials and manufacturing processes. As a result, you will be able to maintain the excellent quality of photovoltaic (PV) modules in manufacturing.
IEC/TS 62804-1-1 Ed.1.0