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PD 6595:1996 | 15 May 1996 | BSI Knowledge
Publication
Withdrawn
PD 6595:1996
Parameter extraction techniques for the European mini test chip
Published:
15 May 1996
•
Withdrawn:
1 May 2004
Overview
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References
History
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Product Details
Descriptors
Electronic equipment and components
Integrated circuits
Metal oxide semiconductors
Transistors
Test equipment
Digital integrated circuits
Microprocessor chips
ICS Codes
31.200 Integrated circuits. Microelectronics
Committee
EPL/501
International relationships
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ISBN
0 580 25604 9
Publisher
BSI