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BS EN 12543-2:1999 | 15 Dec 1999 | BSI Knowledge
Standard
Withdrawn
BS EN 12543-2:1999
Non-destructive testing. Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Pinhole camera radiographic method
Published:
15 Dec 1999
•
Withdrawn:
31 Jul 2008
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Product Details
Descriptors
Rated voltage
Non-destructive testing
Holes
Dimensional measurement
Pinholes
Resolution
Industrial
X-ray tubes
Dimensions
Cameras
Radiographic testing
Testing conditions
Radiography
Test equipment
Focal spots
X-ray apparatus
Electron tubes
ICS Codes
19.100 Non-destructive testing
Committee
WEE/46
International relationships
Identical to:
EN 12543-2:1999
ISBN
0 580 35171 8
Publisher
BSI