PD IEC TS 62607 discusses key control characteristics for Nano-manufacturing. PD IEC TS 62607‑3‑3 outlines a method for determining the fluorescence lifetime of semiconductor quantum dots (QDs) using the time-correlated single-photon counting (TCSPC) technique. TCSPC is suitable for testing fluorescence lifetime in the range from picoseconds to nanoseconds.
PD IEC TS 62607‑3‑3 is only applicable to liquid samples that are stable dispersions of QDs.
PD IEC TS 62607‑3‑3 includes outlines of the experimental procedures, data processing, and case study.
Note 1: PD IEC TS 62607‑3‑3 does not apply to solid samples of TCSPC.
PD IEC TS 62607‑3‑3 on fluorescence lifetime of semiconductor QDs using TCSPC is useful for:
Fluorescence lifetime is considered as the average time that luminescent materials spend in the excited state, that is, before emitting a photon and returning to the ground state. Fluorescence lifetime can vary widely from picoseconds to hundreds of nanoseconds, even to microseconds or milliseconds, depending on the type of luminescent nanomaterials.
PD IEC TS 62607‑3‑3 guideline provides TCSPC fluorescence spectrometer, measurement procedures, instrument preparation, fluorescence lifetime decay curve measurement, and data analysis on fluorescence lifetime of semiconductor quantum dots using time-correlated single-photon counting (TCPS). This helps to determine the environment that the sample molecules inhabit, uncover the size and shape of the sample molecules, reveal the molecular interactions, the distances between different parts of the molecules, and obtain kinetic and dynamic rates.
IEC/TS 62607-3-3 Ed.1.0