Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).

ISO draws attention to the possibility that the implementation of this document may involve the use of (a) patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a) patent(s) which may be required to implement this document. However, implementers are cautioned that this may not represent the latest information, which may be obtained from the patent database available at www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.

Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISO's adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.

This document was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 5, Microscopes and endoscopes.

This second edition cancels and replaces the first edition ISO 10934:2020, which has been technically revised.

The main changes are as follows:

— added new terms for light microscopy: airy beam, Bessel beam, achromatic condenser, detection path, extinction ratio, focal volume, Gaussian beam, illumination path, spatially coherent illumination, temporally coherent illumination, microlens, immersion objective, water dipping objective, hot pixel, dead pixel, stuck pixel, voxel, digital zoom;
— added new terms for advanced techniques in light microscopy: averaging, sampling, sampling rate, Nyquist sampling, oversampling, undersampling, resonant frequency scanning, multi-view fusion, light sheet fluorescence microscopy, spectral unmixing, computational microscopy, stitching, point spread function engineering, high content screening, high throughput screening, light field microscopy, point detector, photodiode, photomultiplier, avalanche photodiode, area detector, linear array sensor, single-photon avalanche diode array, sCMOS, CCD, EMCCD;
— terms amended;
— editorially revised.

Any feedback or questions on this document should be directed to the user’s national standards body. A complete listing of these bodies can be found at www.iso.org/members.html.