Foreword

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This document was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 5, Microscopes and endoscopes.

This second edition cancels and replaces the first edition ISO 10934:2020, which has been technically revised.

The main changes are as follows:

— added new terms for light microscopy: airy beam, Bessel beam, achromatic condenser, detection path, extinction ratio, focal volume, Gaussian beam, illumination path, spatially coherent illumination, temporally coherent illumination, microlens, immersion objective, water dipping objective, hot pixel, dead pixel, stuck pixel, voxel, digital zoom;
— added new terms for advanced techniques in light microscopy: averaging, sampling, sampling rate, Nyquist sampling, oversampling, undersampling, resonant frequency scanning, multi-view fusion, light sheet fluorescence microscopy, spectral unmixing, computational microscopy, stitching, point spread function engineering, high content screening, high throughput screening, light field microscopy, point detector, photodiode, photomultiplier, avalanche photodiode, area detector, linear array sensor, single-photon avalanche diode array, sCMOS, CCD, EMCCD;
— terms amended;
— editorially revised.

Any feedback or questions on this document should be directed to the user’s national standards body. A complete listing of these bodies can be found at www.iso.org/members.html.

ISO 10934:2025

Microscopes. Vocabulary for light microscopy

Current

Published:

7 May 2025

1 Scope