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ISO 22493:2014 | 15 Apr 2014 | BSI Knowledge
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ISO 22493:2014
Microbeam analysis. Scanning electron microscopy. Vocabulary
Current, Under Review
•
Published:
15 Apr 2014
Overview
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Product Details
Descriptors
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ICS Codes
01.040.37 Image technology (Vocabularies)
37.020 Optical equipment
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO