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BS ISO 22493:2008 | 31 Oct 2008 | BSI Knowledge
Standard
Withdrawn
BS ISO 22493:2008
Microbeam analysis. Scanning electron microscopy. Vocabulary
Published:
31 Oct 2008
•
Withdrawn:
30 Apr 2014
Overview
Preview
References
History
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Product Details
Descriptors
Electron beams
Electron optics
Scanning electron microscopes
Instrumental methods of analysis
Optical instruments
Terminology
Vocabulary
Microscopes
Electron microscopes
ICS Codes
01.040.37 Image technology (Vocabularies)
01.040.71 Chemical technology (Vocabularies)
37.020 Optical equipment
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 22493:2008
ISBN
978 0 580 54987 8
Publisher
BSI