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ISO 16700:2016 | 18 Jul 2016 | BSI Knowledge
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ISO 16700:2016
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Current, Under Review
•
Published:
18 Jul 2016
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Product Details
Descriptors
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ICS Codes
37.020 Optical equipment
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO