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BS ISO 16700:2016

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Current, Under Review

•

Published:

31 Jul 2016

Overview
Preview
References
History
Product Details
Descriptors
Calibration
Magnification
Electron optics
Electron microscopes
Microscopes
Optical instruments
Scanning electron microscopes
Control samples
Optical phenomena
Accuracy
Electron beams
ICS Codes
37.020 Optical equipment
Committee
CII/9
International relationships
Identical to:

ISO 16700:2016

ISBN
978 0 580 89052 9
Publisher
BSI