ISO 17297:2025

Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary

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This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

Product Details

Descriptors

Common terms

Electric power transmission

Microscope slides

Specimen preparation

Specimens (testing)

Electron-beam-deflection tubes

ICS Codes

01.040.37 Image technology (Vocabularies)

01.040.71 Chemical technology (Vocabularies)

71.040.50 Physicochemical methods of analysis

Committee

CII/9

International relationships

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ISBN

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Publisher

ISO