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BS ISO 17297:2025 | 31 May 2025 | BSI Knowledge
Standard
BS ISO 17297:2025
Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary
Current
•
Published:
31 May 2025
Overview
Preview
References
History
1 Scope
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using
focused ion beam
(
FIB
).
Product Details
Descriptors
Common terms
Electric power transmission
Microscope slides
Specimen preparation
Specimens (testing)
Electron-beam-deflection tubes
ICS Codes
01.040.71 Chemical technology (Vocabularies)
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 17297
ISBN
978 0 539 24981 1
Publisher
BSI