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24/30465997 DC | 15 Jan 2024 | BSI Knowledge
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24/30465997 DC
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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Published:
15 Jan 2024
Overview
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References
History
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Product Details
Descriptors
Common terms
Electric power transmission
Microscope slides
Specimen preparation
Specimens (testing)
Electron-beam-deflection tubes
ICS Codes
01.040.37 Image technology (Vocabularies)
01.040.71 Chemical technology (Vocabularies)
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 17297
ISBN
—
Publisher
BSI