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BS ISO 22489:2016 | 31 Oct 2016 | BSI Knowledge
Standard
BS ISO 22489:2016
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Current
•
Published:
31 Oct 2016
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Product Details
Descriptors
Test equipment
Spectroscopy
Wavelengths
X-ray analysis
Instrumental methods of analysis
X-rays
Specimen preparation
Microanalysis
Chemical analysis and testing
Dispersion (waves)
Electron beams
ICS Codes
71.040.99 Other standards related to analytical chemistry
Committee
CII/9
International relationships
Identical to:
ISO 22489:2016
ISBN
978 0 580 92670 9
Publisher
BSI