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BS ISO 23833:2006 | 31 Jan 2007 | BSI Knowledge
Standard
Withdrawn
BS ISO 23833:2006
Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
Published:
31 Jan 2007
•
Withdrawn:
30 Apr 2013
Overview
Preview
References
History
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Product Details
Descriptors
Terminology
X-ray analysis
Electron microscopes
Chemical analysis and testing
X-ray fluorescence spectrometry
Vocabulary
Instrumental methods of analysis
Spectroscopy
Microanalysis
Electron beams
ICS Codes
01.040.71 Chemical technology (Vocabularies)
71.040.99 Other standards related to analytical chemistry
Committee
CII/9
International relationships
Identical to:
ISO 23833:2006
ISBN
978 0 580 49972 2
Publisher
BSI