© British Standards Institution 2025
Site Map
Standard

BS ISO 25498:2025

Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

Current

•

Published:

31 May 2025

Overview
Preview
References
History
Product Details
Descriptors
Chemical analysis and testing
Electron diffraction
Spectroscopy
Test specimens
Microanalysis
Crystal lattices
Electron microscopes
Electron beams
Optical instruments
ICS Codes
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:

ISO 25498

ISBN
978 0 539 28629 8
Publisher
BSI