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ISO 20263:2017 | 1 Dec 2017 | BSI Knowledge
Standard
Withdrawn
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ISO 20263:2017
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
Published:
1 Dec 2017
•
Withdrawn:
6 Nov 2024
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Product Details
Descriptors
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ICS Codes
37.020 Optical equipment
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO