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ISO 20263:2024 | 6 Nov 2024 | BSI Knowledge
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ISO 20263:2024
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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Published:
6 Nov 2024
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Product Details
Descriptors
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ICS Codes
37.020 Optical equipment
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO