National foreword

This British Standard is the UK implementation of ISO 19214:2024.

The UK participation in its preparation was entrusted to Technical Committee CII/9, Microbeam analysis.

A list of organizations represented on this committee can be obtained on request to its committee manager.

Contractual and legal considerations

This publication has been prepared in good faith, however no representation, warranty, assurance or undertaking (express or implied) is or will be made, and no responsibility or liability is or will be accepted by BSI in relation to the adequacy, accuracy, completeness or reasonableness of this publication. All and any such responsibility and liability is expressly disclaimed to the full extent permitted by the law.

This publication is provided as is, and is to be used at the recipient’s own risk.

The recipient is advised to consider seeking professional guidance with respect to its use of this publication.

This publication is not intended to constitute a contract. Users are responsible for its correct application.

Compliance with a British Standard cannot confer immunity from legal obligations.

This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 October 2024.

Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types of ISO document should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).

ISO draws attention to the possibility that the implementation of this document may involve the use of (a) patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a) patent(s) which may be required to implement this document. However, implementers are cautioned that this may not represent the latest information, which may be obtained from the patent database available at www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.

Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISO's adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.

This document was prepared by Technical Committee ISO/TC 202, Microbeam analysis, Subcommittee SC 3, Analytical electron microscopy.

This second edition cancels and replaces the first edition (ISO 19214:2017), which has been technically revised.

The main changes are as follows:

the title, introduction and scope have been revised;
Clause 3 has been revised;
Figures 1 and 2 have been replaced;
Annex D has been added;
editorial revisions have been made.

Any feedback or questions on this document should be directed to the user’s national standards body. A complete listing of these bodies can be found at www.iso.org/members.html.

Introduction

Nanocrystals are a main component in some advanced materials, especially nanomaterials, and also appear in traditional materials, such as needle-shaped precipitates in steels and alloys. Controlling the microstructure of these materials during fabrication is very important for quality control considerations. To control the microstructure and thereby improve the service properties of the relevant materials, the apparent growth direction, or the longest axis of the nanocrystals is one of the essential parameters. This direction of nanocrystals is generally determined by transmission electron microscopy (TEM).

1 Scope

This document gives a method for determination of the apparent growth direction of nanocrystals by transmission electron microscopy. This method is applicable to all kinds of wire-like crystalline materials synthetized by various methods. This document can also guide in determining an axis direction of the second-phase particles in steels, alloys, or other materials. The applicable diameter or width of the crystals to be tested is in the range of tens to one hundred nanometres, depending on the accelerating voltage of the transmission electron microscope (TEM) and the material itself. Position, which is curved, twisted, and folded, to determine the apparent growth direction, should not be used.

2 Normative references

3 Terms and definitions

4 Specimens

4.1

4.2

4.3

4.4

5 Analysis procedure

5.1 Setting the TEM operating condition

5.2 Data acquisition

5.3 Determination of the crystalline direction

6 Uncertainty estimation

7 Test report

Bibliography

BS ISO 19214:2024

Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy

Current

Published:

31 Oct 2024