This document provides guidance on the application of various accelerated test techniques for measurement or improvement of item reliability. Identification of potential failure modes that can be experienced in the use of an item and their mitigation is instrumental to ensure dependability of an item.

The object of the methods is to either identify potential design weakness or provide information on item reliability, or to achieve necessary reliability and availability improvement, all within a compressed or accelerated period of time. This document addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability can differ from the standard probability of failure occurrence.

This document also extends to present accelerated testing or production screening methods that would identify weakness introduced into the item by manufacturing error, which can compromise item reliability. Services and people are however not covered by this document.

A Commented Version (CMV) of this standard is available here. Please note, the CMV of the standard is not adopted, and therefore doesn’t contain an additional national foreword, or national annex that might be contained in the BS adoption of the standard. However the IEC text that forms the content of the standard is identical to the BS adoption of the standard.

Commented Versions (CMVs) are specialized publications featuring detailed commentary from technical experts on the major changes between the new edition of a standard and the previous one. Comments may include an explanation for the changes as well as information on the impact of these changes on the application and usability of the standard.