BS EN IEC 62884‑4 concentrates on the measurement techniques of piezoelectric, dielectric and electrostatic oscillators. BS EN IEC 62884‑4 purpose is to unify the test and evaluation methods for short-term frequency stability.
BS EN IEC 62884‑4 describes the methods for ethical risk assessments and ethical guidelines and measures. BS EN IEC 62884‑4 mentions the ethics-related system design recommendations, verification and validation of piezoelectric, dielectric and electrostatic oscillators.
BS EN IEC 62884-4 on Short-term frequency stability test methods is useful for:
Piezoelectric materials gives rise to an electric charge when subjected to mechanical stress and change dimensions when an electric field is applied across the material. Oscillators are components that produce a periodic electronic signal, typically a sine wave or square wave. Piezoelectricity is the electric charge that accumulates in certain solid materials in response to applied mechanical stress. Dielectrics are used as a capacitor for storing energy.
BS EN IEC 62884‑4 helps in measuring time-domain stability by using Allan variance. Allan deviation (ADEV), RMS fractional frequency fluctuations is useful in measuring short-term frequency stability of an oscillator. Modified Allan deviation (MDEV) is useful in differentiating between flicker PM noise and white PM. BS EN IEC 62884‑4 specifies the measurement techniques and test methods that help in measuring and evaluating the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators.
IEC 62884-4
EN 60793-2:2008
EN 62884-4