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PD 6598:1996 | 15 Jul 1996 | BSI Knowledge
Publication
Withdrawn
PD 6598:1996
Measurement techniques for the characterization of the European mini test chip
Published:
15 Jul 1996
•
Withdrawn:
1 May 2004
Overview
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References
History
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Product Details
Descriptors
Metal oxide semiconductors
Digital integrated circuits
Dimensional measurement
Frequency measurement
Transistors
Capacitance measurement
Thickness measurement
Current measurement
Electrical measurement
Microprocessor chips
Capacitors
ICS Codes
31.200 Integrated circuits. Microelectronics
Committee
EPL/501
International relationships
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ISBN
0 580 25804 1
Publisher
BSI