BS EN IEC 63185:2021

What is IEC 63185 about?  

IEC 63185 specifies a measurement method for complex permittivity of dielectric substrates at microwave and millimetre-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimetre-wave circuits and devices.  

The method outlined in IEC 63185 uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is considered accurately on the basis of the mode-matching analysis. 

In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, this method has the following characteristics: 

• The values of the relative permittivity εr’ and loss tangent tanδ normal to dielectric plate samples can be measured accurately and non-destructively 
• This method presents broadband measurements by using higher-order modes by one resonator 
• This method is applicable for the measurements on the following condition 

Who is IEC 63185 for? 

IEC 63185 on complex permittivity is applicable to: 

• Microwave communication engineers 
• Scientists and applied physicists 
• Electrical and electronics engineers 
• Advanced microwave 
• MM-Wave  
• THz devices 
• Microwave and millimetre-wave circuits and devices 

Why should you use IEC 63185? 

IEC 63185 provides a method to evaluate the dielectric properties of low-loss materials used in microwave and millimetre-wave circuits and devices. The low use of low-loss materials improves the quality and efficiency of microwave and millimetre-wave circuits and devices. 

Apply IEC 63185 guidelines of measurement of the complex permittivity in the low-loss dielectric to improve the performance of microwave and millimetre-wave circuits and devices.