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SAE J1752/3:2017 | 22 Sep 2017 | BSI Knowledge
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SAE J1752/3:2017
Measurement of Radiated Emissions from Integrated Circuits. TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)(STABILIZED Sep 2017)
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Published:
22 Sep 2017
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ICS Codes
33.100.10 Emission
43.040.10 Electrical and electronic equipment
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Publisher
SAE