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SAE J1752/2_201609:2016 | 1 Mar 1995 | BSI Knowledge
Standard
SAE J1752/2_201609:2016
Measurement Of Radiated Emissions From Integrated Circuits?Surface Scan Method (Loop Probe Method) 10 Mhz To 3 Ghz
Current
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Published:
1 Mar 1995
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Product Details
Descriptors
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ICS Codes
33.100.10 Emission
43.040.10 Electrical and electronic equipment
Committee
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International relationships
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ISBN
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Publisher
SAE