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ISO 16700:2004 | 15 Mar 2004 | BSI Knowledge
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ISO 16700:2004
ISO16700 : 2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
Published:
15 Mar 2004
•
Withdrawn:
18 Jul 2016
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Product Details
Descriptors
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ICS Codes
37.020 Optical equipment
Committee
CII/9
International relationships
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ISBN
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Publisher
ISO