Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. BS EN 62132-2 is a part of an international multi-series standard that focuses on aspects of integrated circuits.
BS EN 62132-2 specifies a method for measuring the immunity of an integrated circuit to radiofrequency radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz or as limited by the characteristics of the TEM cell. BS EN 62132-2 discusses terms and definitions, general data, test conditions, test equipment, test setup, test procedure, test report and RF immunity acceptance level.
BS EN BS EN 62132-2 on the radiated immunity of integrated circuits is useful for:
Integrated circuits are fundamental building blocks of modern electronic devices. They function as oscillators, timers, computer memory, amplifiers, microcontroller, microprocessors, counters, or logic gates. There are certain specifications regarding the performance of these semiconductor devices.
BS EN 62132-2 provides users with terms, definitions and general information that depicts a clearer idea of the TEM cell method for integrated circuits. BS EN 62132-2 provides users with a test procedure to assess the radiated immunity of integrated circuits which ensures their reliability. The guidelines in BS EN 62132-2 help users manufacture highly efficient integrated circuits to provide a superior quality product to their customers.
EN 62132-2:2011
IEC 62132-2:2010
IEC TS 61508-3-1:2016