BS EN 62132-8:2012

What is BS EN 62132-8 - Radiated immunity of integrated circuits about? 

Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. BS EN 62132-8 is a part of an international multi-series standard that focuses on aspects of integrated circuits. 

BS EN 62132-8 specifies a method for measuring the immunity of an integrated circuit to radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz. BS EN 62132-8  discusses terms and definitions, general data, test conditions, test equipment, test setup, test procedure, test report and RF immunity acceptance level. 

Who is BS EN 62132-8 - Radiated immunity of integrated circuits for? 

BS EN BS EN 62132-8 on the radiated immunity of integrated circuits is useful for: 

• Manufacturer of electronic equipment and components 
• Manufacturer of electrical equipment and components 
• Maintenance and augmentation teams 
• Companies associated with designing and installation of electronic devices 
• Fault management teams 
• Quality management teams 

Why should you use BS EN 62132-8 - Radiated immunity of integrated circuits? 

Integrated circuits are fundamental building blocks of modern electronic devices. They function as oscillators, timers, computer memory, amplifiers, microcontroller, microprocessors, counters, or logic gates. There are certain specifications regarding the performance of these semiconductor devices. 

BS EN 62132-8 provides users with terms, definitions and general information that depicts a clearer idea of the IC stripline method for integrated circuits. BS EN 62132-8 provides users with a test procedure to assess the radiated immunity of integrated circuits which ensures their reliability. The guidelines in BS EN 62132-8 help users manufacture highly efficient integrated circuits to provide a superior quality product to their customers.