BS EN 62132-1 is the first part of an international standard used for integrated circuits that specifies the test methods and procedure for measuring the immunity of these circuits. BS EN 62132-1 is useful in producing good quality circuits used in electronic devices.
BS EN 62132-1 provides general information and definitions about the measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series.
Note: Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).
BS EN 62132-1on Integrated circuits are useful for:
Integrated circuits are a set of electronic circuits used in a semiconductor material.
BS EN 62132-1 specifies the test method and test procedure for integrated circuits. This test method helps in measuring the immunity of these circuits. By using BS EN 62132-1 you can determine the frequency range of integrated circuits. A monitoring check is useful in identifying the defects of the circuits.
Using BS EN 62132-1 you can ensure the sustainability of these circuitsand manufacture better quality integrated circuits used in electronic devices.
BS EN 62132-1 supersedes BS EN 62132-1:2006. BS EN 62132-1 includes some technical changes with respect to BS EN 62132-1:2006. These include:
EN 62132-1:2016
IEC 62132-1:2015