Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. BS EN 62132-4 is a part of an international multi-series standard that focuses on aspects of integrated circuits.
BS EN 62132-4 describes a method to measure the immunity of integrated circuits in the presence of conducted radiofrequency disturbances, e.g. resulting from radiated radiofrequency disturbances. This method in BS EN 62132-4 guarantees a high degree of repeatability and correlation of immunity measurements.
BS EN 62132-4 establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radiofrequency electromagnetic waves.
BS EN BS EN 62132-4 on the electromagnetic immunity of integrated circuits is useful for:
Integrated circuits are fundamental building blocks of modern electronic devices. They function as oscillators, timers, computer memory, amplifiers, microcontroller, microprocessors, counters, or logic gates. There are certain specifications regarding the performance of these semiconductor devices.
BS EN 62132-4 provides users with terms, definitions and general information that depicts a clearer idea of the direct RF power injection method for integrated circuits. BS EN 62132-4 provides users with a test procedure to assess the electromagnetic immunity of integrated circuits which ensures their reliability. The guidelines in BS EN 62132-4 help users manufacture highly efficient integrated circuits to provide a superior quality product to their customers.
EN 62132-4:2006
IEC 62132-4:2006