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IEC 60749-26:2003 | 1 Oct 2003 | BSI Knowledge
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IEC 60749-26:2003
IEC60749-26 : 2003 semiconductor devices - Mechanical and climatic test methods - Part 26: Electostatic discharge (ESD) sensivity testing - Human body model (HBM)
Published:
1 Oct 2003
•
Withdrawn:
Date not available
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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
2 8318 7221 9
Publisher
IEC