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ASTM F1893 - 18 | 1 Mar 2018 | BSI Knowledge
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ASTM F1893 - 18
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Published:
1 Mar 2018
•
Withdrawn:
6 Dec 2023
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ICS Codes
31.080.01 Semiconductor devices in general
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ISBN
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ASTM