PD IEC/TR 62627 is a series on fibre optic interconnecting devices and passive components. Fibre optic interconnecting devices and passive components is a fibre optic telecommunications technology for delivering broadband network access to end customers. PD IEC/TR 62627-03-04 is a technical report, is a guideline for a procedure to evaluate the reliability of passive optical components under high power conditions. This guideline is one example to which the test results of IEC/TR 62627-03-02 and IEC/TR 62627-03-03 may apply.
PD IEC/TR 62627-03-04 on fibre optic interconnecting devices and passive components is useful for:
Since 2000, the optical power in transmission systems has increased in conjunction with the increase in the number of channels for DWDM systems, with the deployment of RAMAN amplifiers and the application of optical amplifiers. Several technical reports have been published on failure mode analysis, lifetime estimation by accelerated ageing tests, and other issues for passive optical components. The long-term reliability of passive optical components is generally evaluated by accelerated ageing tests such as a high-temperature test, a damp heat test and a temperature cycling test. These tests are standardized and are included in reliability qualification test documents. Although the failure mode for passive optical components under high power conditions has not been clarified, one technical report was published for specific passive optical components (IEC/TR 62627-03-02), and a technical report on high power reliability testing for metal-doped fibre plug-style optical attenuators was proposed. PD IEC/TR 62627-03-04 is prepared based on the knowledge contained within these two technical reports.
PD IEC/TR 62627-03-04 describes the return losses of metal-doped fibre plug-style optical attenuators degraded under high optical input power at around 2 W, and the fibre in the ferrule of in-line optical isolators breaking and causing isolation failure. PD IEC/TR 62627-03-04 also describes the estimated maximum input power that will assure long term operation. A similar approach found in the study of high-power reliability for passive optical components seems to be useful and effective. PD IEC/TR 62627-03-04 defines a step-stress test that is carried out for the DUT (device under test), or for parts considered likely to fail. IEC 61300-2-14 describes the detailed procedure of the step-stress test of high-power damage threshold power characterization. If it is likely that the failure modes are due to a quality change in some specific materials, the material itself should be tested before testing components to determine the beam density to be used. Using PD IEC/TR 62627-03-04 you can specify the procedure to evaluate the reliability of passive optical components under high power conditions.
IEC TR 62627-03-04:2013