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ISO 16413:2013 | 15 Feb 2013 | BSI Knowledge
Standard
Withdrawn
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ISO 16413:2013
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Published:
15 Feb 2013
•
Withdrawn:
14 Aug 2020
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Product Details
Descriptors
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ICS Codes
35.240.70 IT applications in science
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
ISO