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BS ISO 16413:2020 | 31 Aug 2020 | BSI Knowledge
Standard
BS ISO 16413:2020
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Current
•
Published:
31 Aug 2020
Overview
Preview
References
History
Product Details
Descriptors
X-ray apparatus
X-ray analysis
Instruments
Density measurement
X-rays
Thickness measurement
ICS Codes
35.240.70 IT applications in science
71.040.40 Chemical analysis
Committee
CII/60
International relationships
Identical to:
ISO 16413:2020
ISBN
978 0 539 01652 9
Publisher
BSI