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25/30513804 DC | 25 Mar 2025 | BSI Knowledge
Standard
25/30513804 DC
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers - Part 1. Classification of defects
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Published:
25 Mar 2025
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Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
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ISBN
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Publisher
BSI