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26/30559865 DC | 15 Apr 2026 | BSI Knowledge
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26/30559865 DC
Draft BS IEC 63551-1 Semiconductor devices. Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR
Current
•
Published:
15 Apr 2026
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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
EN IEC 63551-1 ED1
IEC 63551-1 ED1
ISBN
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Publisher
BSI